CTU Prague - Department of Physical Electronics


Research project "Two-dimensional mapping of element concentrations by PIXE analysis"



The objective of the project is to upgrade the existing facility to a two-dimensional mapping PIXE submilliprobe. Trace element analysis by macro-PIXE is presently a standard analytical technique in the laboratory. Various samples are analyzed: fine aerosol particles on a filter, thick or thin layers of materials, paste-like or liquid samples. Generally, the minimum amount of analyzed material required by PIXE is very small, even a few micrograms. However, the analyzed surface of the sample is presently several mm in diameter. The objective is a major improvement - upgrade to a submillimeter probe. That requires: i) a precise target positioning and beam spot localization with accuracy better than a tenth of a millimeter, ii) improvement of monitoring of the beam stability and transport along the vacuum line, iii) proton charge measurement system in the given experimental geometry. There is a variety of suitable applications for the proposed submillimeter probe including: monitoring of structural changes of tissues in medical sciences, analysis of minerals in geology, or studies of archaeological samples and artifacts. As an initial application, analysis of selected types of samples will be carry out. Knowledge of elemental maps in the vicinity of weld helps our understanding of diffussion processes or another effects occurring during the welding process. As a quality check, a comparison between the PIXE analysis in the applicant’s laboratory and ICP-MS analysis in an external laboratory will be carried out on minerals, bones and other samples.

summary of projects

Research team:

CTU Prague, Ion beam group: Josef Voltr , Jaroslav Kral , Zdenek Nejedly , Radan Salomonovic
Czech Welding Institute, Ostrava: Stanislav Simcik
Faculty of Science Charles University, Prague: Martin Mihaljevic



8.10.1998 Josef Voltr